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1

The Impact of Different TiN Capping Metal Thicknesses on High-k Oxygen Vacancies in n-MOSFETs

Liao, Jih-Chien, Chang, Ting-Chang, Syong, Wei-Ren, Lu, Ying-Hsin, Liu, Hsi-Wen, Lin, Chien-Yu, Ciou, Fong-Min, Lin, Yu-Shan, Lien, Chen-Hsin, Cheng, Osbert, Huang, Cheng-Tung, Yen, Wei-Ting

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 497 KB

english, 2017

2

An Investigation of Electrothermal Characteristics on Low-Temperature Polycrystalline-Silicon Thin-Film Transistors

Ya-Li Tai,, Jam-Wem Lee,, Chen-Hsin Lien,

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2010

Language:

english

File:

PDF, 404 KB

english, 2010

3

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - A voltage base electrothermal model for the interconnection and E-Fuse under the DC and pulse stresses

Lee, Jian-Hsing, Prabhu, Manjunatha, Iyer, Natarajan Mahadeva, Wu, Cheng-Hsu, Chen-Hsin Lien,

Year:

2014

Language:

english

File:

PDF, 586 KB

english, 2014

4

[IEEE 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Xian, China (2012.10.29-2012.11.1)] 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology - Circuit design challenges and trends in read sensing schemes for resistive-type emerging nonvolatile memory

Chang, Meng-Fan, Lin, Ku-Feng, Chuang, Ching-Hao, Huang, Li-Yue, Chien, Tun-Fei, Sheu, Shyh-Shyuan, Su, Keng-Li, Lee, Heng-Yuan, Chen, Frederick T., Lien, Chen-Hsin, Chen, Ping-Cheng, Chiou, Lih-Yih,

Year:

2012

Language:

english

File:

PDF, 1.35 MB

english, 2012

5

Effect of Mixed-Mode Electrical Stress on High-Frequency and RF Power Characteristics of SiGe Hetero-Junction Bipolar Transistors

Hung, Cheng-Chou, Liao, Wen-Shiang, Huang, Sheng-Yi, Chen, Kun-Ming, Huang, Guo-Wei, Lien, Chen-Hsin

Journal:

Japanese Journal of Applied Physics

Year:

2008

Language:

english

File:

PDF, 489 KB

english, 2008

6

Fast-IV Measurement Investigation of the Role of TiN Gate Nitrogen Concentration on Bulk Traps in HfO 2 Layer in p-MOSFETs

Lu, Ying-Hsin, Chang, Ting-Chang, Liao, Jih-Chien, Chen, Li-Hui, Lin, Yu-Shan, Chen, Ching-En, Liu, Kuan-Ju, Liu, Xi-Wen, Lin, Chien-Yu, Lien, Chen-Hsin, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Chen

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 517 KB

english, 2017

7

Abnormal relationship between hot carrier stress degradation and body current in high-k metal gate in the 14nm node

Chang, Kai-Chun, Liao, Jih-Chien, Chang, Ting-Chang, Yeh, Chien-Hung, Lin, Chien-Yu, Jin, Fu-Yuan, Lin, Yu-Shan, Ciou, Fong-Min, Hung, Wei-Chun, Lin, Yun-Hsuan, Lien, Chen-Hsin, Cheng, Osbert, Huang,

Journal:

IEEE Electron Device Letters

Year:

2019

Language:

english

File:

PDF, 6 KB

english, 2019

8

Infrared spectrum of hydrogen in the condensed phase with high-sensitivity spectrometers: Experiments with a 0.04-cm−1 Fourier transform spectrometer in the range 1.5–12 μm

T.K. Balasubramanian, Chen-Hsin Lien, James R. Gaines, K. Narahari Rao, E.K. Damon, R.J. Nordstrom

Journal:

Journal of Molecular Spectroscopy

Year:

1982

Language:

english

File:

PDF, 472 KB

english, 1982

9

Characteristics of poly-Si TFT combined with nonvolatile SONOS memory and nanowire channels structure

Shih-Ching Chen, Ting-Chang Chang, Po-Tsun Liu, Yung-Chun Wu, Po-Shun Lin, Shih-Cheng Chen, Jing-Yi Chin, S.M. Sze, Chun-Yen Chang, Chen-Hsin Lien

Journal:

Surface and Coatings Technology

Year:

2007

Language:

english

File:

PDF, 762 KB

english, 2007

10

High-performance polycrystalline silicon thin-film transistors with oxide–nitride–oxide gate dielectric and multiple nanowire channels

Shih-Ching Chen, Ting-Chang Chang, Po-Tsun Liu, Y.C. Wu, C.C. Tsai, T.S. Chang, Chen-Hsin Lien

Journal:

Thin Solid Films

Year:

2006

Language:

english

File:

PDF, 703 KB

english, 2006

11

A High-Speed 7.2-ns Read-Write Random Access 4-Mb Embedded Resistive RAM (ReRAM) Macro Using Process-Variation-Tolerant Current-Mode Read Schemes

Chang, Meng-Fan, Sheu, Shyh-Shyuan, Lin, Ku-Feng, Wu, Che-Wei, Kuo, Chia-Chen, Chiu, Pi-Feng, Yang, Yih-Shan, Chen, Yu-Sheng, Lee, Heng-Yuan, Lien, Chen-Hsin, Chen, Frederick T., Su, Keng-Li, Ku, Tzu-

Journal:

IEEE Journal of Solid-State Circuits

Year:

2013

Language:

english

File:

PDF, 3.34 MB

english, 2013

12

A Novel Nanowire Channel Poly-Si TFT Functioning as Transistor and Nonvolatile SONOS Memory

. Shih-ching Chen, . Ting-chang Chang, . Po-tsun Liu, . Yung-chun Wu, . Po-shun Lin, . Bae-heng Tseng, . Jang-hung Shy, S. M. Sze, . Chun-yen Chang, . Chen-hsin Lien

Journal:

IEEE Electron Device Letters

Year:

2007

Language:

english

File:

PDF, 285 KB

english, 2007

13

[IEEE 2011 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu, Taiwan (2011.04.25-2011.04.27)] Proceedings of 2011 International Symposium on VLSI Technology, Systems and Applications - Impact of compliance current overshoot on high resistance state, memory performance, and device yield of HfOx based resistive memory and its solution

Chen, Yu-Sheng, Liu, Wen-Hsing, Lee, Heng-Yuan, Chen, Pang-Shiu, Wang, Sum-Min, Tsai, Chen-Han, Hsu, Yen-Ya, Gu, Pei-Yi, Chen, Wei-Su, Chen, Frederick, Lien, Chen-Hsin, Tsai, Ming-Jinn

Year:

2011

Language:

english

File:

PDF, 335 KB

english, 2011

14

[IEEE 2012 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu (2012.04.23-2012.04.25)] Proceedings of Technical Program of 2012 VLSI Technology, System and Application - Suppressed soft-errors and highly reduced current for HfOX based unipolar RRAM by inserting AlOX layer

Yu-Sheng Chen,, Heng-Yuan Lee,, Pang-Shiu Chen,, Kan-Hsueh Tsai,, Tai-Yuan Wu,, Wei-Su Chen,, Chen-Han Tsai,, Pei-Yi Gu,, Yi-Ying Liao,, Chen, F., Chen-Hsin Lien,, Ming-Jinn Tsai,

Year:

2012

Language:

english

File:

PDF, 671 KB

english, 2012

15

[IEEE 2008 International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA) - Hsinchu, Taiwan (2008.04.21-2008.04.23)] 2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) - HfO2 Bipolar Resistive Memory Device with Robust Endurance using AlCu as Electrode

Lee, Heng-Yuan, Chen, Pang-Shiu, Wu, Tai-Yuan, Wang, Ching-Chiun, Tzeng, Pei-Jer, Lin, Cha-Hsin, Chen, Frederick, Lien, Chen-Hsin, Tsai, Ming-Jinn

Year:

2008

Language:

english

File:

PDF, 232 KB

english, 2008

16

[IEEE 2013 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2013.12.9-2013.12.11)] 2013 IEEE International Electron Devices Meeting - Ultra high density 3D via RRAM in pure 28nm CMOS process

Hsieh, Min-Che, Liao, Yu-Cheng, Chin, Yung-Wen, Lien, Chen-Hsin, Chang, Tzong-Sheng, Chih, Yue-Der, Natarajan, Sreedhar, Tsai, Ming-Jinn, King, Ya-Chin, Lin, Chrong Jung

Year:

2013

Language:

english

File:

PDF, 3.40 MB

english, 2013

17

Pi-shape gate polycrystalline silicon thin-film transistor for nonvolatile memory applications

Chen, Shih-Ching, Chang, Ting-Chang, Liu, Po-Tsun, Wu, Yung-Chun, Ko, Chin-Cheng, Yang, Sidney, Feng, Li-Wei, Sze, S. M., Chang, Chun-Yen, Lien, Chen-Hsin

Journal:

Applied Physics Letters

Year:

2007

Language:

english

File:

PDF, 379 KB

english, 2007

18

Evaluating the CDM-Robustness of the input buffer with very fast transmission line pulse

Kao, Tzu-Cheng, Lee, Jian-Hsing, Hung, Chung-Yu, Lien, Chen-Hsin, Su, Hung-Der

Journal:

Solid-State Electronics

Year:

2015

Language:

english

File:

PDF, 4.13 MB

english, 2015

19

Nonvolatile Si∕SiO[sub 2]∕SiN∕SiO[sub 2]∕Si type polycrystalline silicon thin-film-transistor memory with nanowire channels for improvement of erasing characteristics

Chen, Shih-Ching, Chang, Ting-Chang, Liu, Po-Tsun, Wu, Yung-Chun, Chin, Jing-Yi, Yeh, Ping-Hung, Feng, Li-Wei, Sze, S. M., Chang, Chun-Yen, Lien, Chen-Hsin

Journal:

Applied Physics Letters

Year:

2007

Language:

english

File:

PDF, 431 KB

english, 2007

20

and the Inference of the Phonon Density of States

Balasubramanian, T. K., Lien, Chen-Hsin, Rao, K. Narahari, Gaines, J. R.

Journal:

Physical Review Letters

Year:

1981

Language:

english

File:

PDF, 707 KB

english, 1981

21

[IEEE Proceedings of 2010 International Symposium on VLSI Technology, System and Application - Hsin Chu, Taiwan (2010.04.26-2010.04.28)] Proceedings of 2010 International Symposium on VLSI Technology, System and Application - Comprehensively study of read disturb immunity and optimal read scheme for high speed HfOx based RRAM with a Ti layer

Lee, Heng-Yuan, Chen, Yu-Sheng, Chen, Pang-Shiu, Gu, Pei-Yi, Hsu, Yen-Ya, Liu, Wen-Hsin, Chen, Wei-Su, Tsai, Chen Han, Chen, Frederick, Lien, Chen-Hsin, Tsai, Ming-Jinn

Year:

2010

Language:

english

File:

PDF, 485 KB

english, 2010

22

Failure mechanism for input buffer under CDM test

Weng, Wu-Te, Lee, Jian-Hsing, Hung, Chung-Yu, Chiu, Chien-Wei, Lien, Chen-Hsin, Su, Hung-Der, Lo, Kuo-Hsuan, Kao, Tzu-Cheng

Journal:

Electronics Letters

Year:

2014

Language:

english

File:

PDF, 445 KB

english, 2014

23

Local Oxidation Fin-Field-Effect-Transistor Structure for Nanodevice Applications

Tai, Ya-Li, Lee, Jam-Wem, Lien, Chen-Hsin

Journal:

Japanese Journal of Applied Physics

Year:

2010

Language:

english

File:

PDF, 810 KB

english, 2010

24

[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - Enhanced CDM-robustness for the packaged IC with the extra bonding wire to the die-attach plate

Kao, Tzu-Cheng, Lee, Jian-Hsing, Lien, Chen-Hsin, Wang, Chih-Hsien, Tai, Kuang-Cheng, Su, Hung-Der

Year:

2015

Language:

english

File:

PDF, 461 KB

english, 2015

25

[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - Robust ESD self-protected LDNMOSFET by an enhanced displacement-current triggering

Kao, Tzu-Cheng, Lien, Chen-Hsin, Chiu, Chien-Wei, Lee, Jian-Hsing, Lo, Yen-Hsiang, Hung, Chung-Yu, Huang, Tsung-Yi, Su, Hung-Der

Year:

2015

Language:

english

File:

PDF, 715 KB

english, 2015

26

[IEEE 2016 IEEE International Reliability Physics Symposium (IRPS) - Pasadena, CA, USA (2016.4.17-2016.4.21)] 2016 IEEE International Reliability Physics Symposium (IRPS) - Failure mechanism of high-voltage isolated lateral diffused NMOS under high-current events

Wu, Cheng-Hsu, Lien, Chen-Hsin, Lee, Jian-Hsing

Year:

2016

Language:

english

File:

PDF, 623 KB

english, 2016

27

A New Low-Voltage Triggering SCR for the Protection of a Double RESURF HV-LDMOS

Wu, Cheng-Hsu, Lee, Jian-Hsing, Lien, Chen-Hsin

Journal:

IEEE Electron Device Letters

Year:

2016

Language:

english

File:

PDF, 720 KB

english, 2016

28

Abnormal Recovery Phenomenon Induced by Hole Injection during Hot Carrier Degradation in Silicon-on-Insulator n-type Metal-Oxide-Semiconductor Transistors

Lu, Ying-Hsin, Chang, Ting-Chang, Chen, Li-Hui, Lin, Yu Shan, Liu, Xi-Wen, Lin, Chien-Yu, Liao, Jih-Chien, Lien, Chen-Hsin, Chang, Kuan-Chang, Zhang, Sheng-Dong

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 754 KB

english, 2017

29

Multilayer Graphene–WSe 2 Heterostructures for WSe 2 Transistors

Tang, Hao-Ling, Chiu, Ming-Hui, Tseng, Chien-Chih, Yang, Shih-Hsien, Hou, Kuan-Jhih, Wei, Sung-Yen, Huang, Jing-Kai, Lin, Yen-Fu, Lien, Chen-Hsin, Li, Lain-Jong

Journal:

Year:

2017

Language:

english

File:

PDF, 4.63 MB

english, 2017

30

Reversible and Precisely Controllable p/n-Type Doping of MoTe 2 Transistors through Electrothermal Doping

Chang, Yuan-Ming, Yang, Shih-Hsien, Lin, Che-Yi, Chen, Chang-Hung, Lien, Chen-Hsin, Jian, Wen-Bin, Ueno, Keiji, Suen, Yuen-Wuu, Tsukagoshi, Kazuhito, Lin, Yen-Fu

Journal:

Advanced Materials

Year:

2018

Language:

english

File:

PDF, 1.82 MB

english, 2018

31

An Investigation of Anode Hole Injection-Induced Abnormal Body Current in n-Channel HfO 2 /TiN MOSFETs

Liao, Jih-Chien, Chang, Ting-Chang, Syong, Wei-Ren, Chang, Kai-Chun, Lu, Ying-Hsin, Liu, Hsi-Wen, Lin, Chien-Yu, Chen, Li-Hui, Jin, Fu-Yuan, Chen, Yu-Hsuan, Lien, Chen-Hsin, Cheng, Osbert, Huang, Chen

Journal:

IEEE Journal of the Electron Devices Society

Year:

2018

Language:

english

File:

PDF, 1.24 MB

english, 2018

32

Room-Temperature Ferroelectricity in Hexagonally Layered α-In 2 Se 3 Nanoflakes down to the Monolayer Limit

Xue, Fei, Hu, Weijin, Lee, Ko-Chun, Lu, Li-Syuan, Zhang, Junwei, Tang, Hao-Ling, Han, Ali, Hsu, Wei-Ting, Tu, Shaobo, Chang, Wen-Hao, Lien, Chen-Hsin, He, Jr-Hau, Zhang, Zhidong, Li, Lain-Jong, Zhang,

Journal:

Advanced Functional Materials

Year:

2018

Language:

english

File:

PDF, 2.27 MB

english, 2018

33

Atomically thin van der waals tunnel field-effect transistors and its potential for applications

Yang, Shih-Hsien, Yao, You-Teng, Xu, Yong, Lin, Che-Yi, Chang, Yuan-Ming, Suen, Yuen-Wuu, Sun, Huabin, Lien, Chen-Hsin, Li, Wenwu, Lin, Yen-Fu

Journal:

Year:

2018

Language:

english

File:

PDF, 1.32 MB

english, 2018

34

Low-Voltage Operational, Low-Power Consuming, and High Sensitive Tactile Switch Based on 2D Layered InSe Tribotronics

Li, Mengjiao, Yang, Feng-Shou, Hsiao, Yung-Chi, Lin, Che-Yi, Wu, Hsing-Mei, Yang, Shih-Hsien, Li, Hao-Ruei, Lien, Chen-Hsin, Ho, Ching-Hwa, Liu, Heng-Jui, Li, Wenwu, Lin, Yen-Fu, Lai, Ying-Chih

Journal:

Advanced Functional Materials

Year:

2019

Language:

english

File:

PDF, 4.18 MB

english, 2019

35

The Effect of Humidity on Reducing Forming Voltage in Conductive-Bridge Random Access Memory with an Alloy Electrode

Lin, Shih-Kai, Chen, Min-Chen, Chang, Ting-Chang, Lien, Chen-Hsin, Chang, Jing-Shuen, Wu, Cheng-Hsien, Tseng, Yi-Ting, Xu, You-Lin, Huang, Kai-Lin, Sun, Li-Chuan, Zhang, Yong-Ci, Chiu, Yu-Ju, Sze, Sim

Journal:

IEEE Electron Device Letters

Year:

2019

Language:

english

File:

PDF, 1.42 MB

english, 2019

36

High-Mobility InSe Transistors: the Nature of Charge Transport

Tsai, Tsung-Han, Yang, Feng-Shou, Ho, Po-Hsun, Liang, Zheng-Yong, Lien, Chen-Hsin, Ho, Ching-Hwa, Lin, Yen-Fu, Chiu, Po-Wen

Journal:

ACS Applied Materials & Interfaces

Year:

2019

Language:

english

File:

PDF, 970 KB

english, 2019

37

Multifunctional full-visible-spectrum optoelectronics based on a van der Waals heterostructure

Yang, Shih-Hsien, Lee, Ko-Chun, Tsai, Meng-Yu, Chang, Yuan-Ming, Lin, Che-Yi, Yang, Feng-Shou, Watanabe, Kenji, Taniguchi, Takashi, Lien, Chen-Hsin, Ho, Ching-Hwa, Li, Mengjiao, Lin, Yen-Fu, Lai, Ying

Journal:

Year:

2019

Language:

english

File:

PDF, 2.92 MB

english, 2019

38

Improving a-InGaZnO TFTs Reliability by Optimizing Electrode Capping Structure under Negative Bias Illumination Stress

Tu, Yu-Fa, Lu, I-Nien, Chen, Hong-Chih, Su, Wan-Ching, Hung, Yang-Hao, Zhou, Kuan-Ju, Zheng, Yu-Zhe, Sun, Li-Chuan, Shih, Yu-Shan, Chen, Jian-Jie, Lien, Chih-Ying, Huang, Hui-Chun, Lien, Chen-Hsin, Ch

Journal:

IEEE Electron Device Letters

Year:

2020

File:

PDF, 939 KB

2020

39

Inverse paired-pulse facilitation in neuroplasticity based on interface-boosted charge trapping layered electronics

Lee, Ko-Chun, Li, Mengjiao, Chang, Yu-Hsiang, Yang, Shih-Hsien, Lin, Che-Yi, Chang, Yuan-Ming, Yang, Feng-Shou, Watanabe, Kenji, Taniguchi, Takashi, Ho, Ching-Hwa, Lien, Chen-Hsin, Lin, Shu-Ping, Chiu

Journal:

Year:

2020

File:

PDF, 3.48 MB

2020

40

[IEEE 2020 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) - Hsinchu, Taiwan (2020.8.10-2020.8.13)] 2020 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) - Giant Electroresistance Switching of Two-dimensional Ferroelectric Î±-In 2 Se 3 on p + -Si

Lee, Ko-Chun, Retamal, Jose Ramon Duran, Xue, Fei, Cheng, Bin, Tang, Hao-Ling, Chiu, Ming-Hui, Hu, Wei-Jin, Wu, Chih-I, Chen, Mei-Hsin, Li, Lain-Jong, Lien, Chen-Hsin, He, Jr-Hau

Year:

2020

File:

PDF, 540 KB

2020

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